Method and apparatus for measurement of exit pupil transmittance

ABSTRACT

A method and apparatus for determining the state of the lens transmittance of an optical projection system are described. A lens or imaging objective transmission is determined as a function of exit pupil transverse direction cosine (nx,ny) at multiple field points thereby providing a more complete analysis and correction of a photolithographic exposure system. The entrance pupil of a projection imaging system is uniformly illuminated and the angular dependence of transmission through the imaging system as a function of exit pupil direction cosines is determined. The illumination source includes a light conditioner with an in-situ illumination structure (ISIS), which is an optical structure that can provide uniform illumination of the system&#39;s entrance pupil.

REFERENCE TO PRIORITY DOCUMENT

This application is a divisional of U.S. application Ser. No. 11/105,799filed on Apr. 13, 2004 and claims the benefit of priority of U.S.Provisional Patent Application Ser. No. 60/562,632, entitled “Method andApparatus for Measurement of Exit Pupil Transmittance”, by Adlai Smith,filed Apr. 14, 2004. All of which are hereby incorporated by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates generally to characterization of theoptical performance of a projection imaging system, in particular, themeasurement of the exit pupil transmittance of a projection imagingsystem.

2. Background

Improving the performance of existing and future steppers can have alarge impact on the economics of projection imaging systems, such asthose used in the production of microchips and flat panel displays.There has been some development of techniques to improve projectionimaging systems through minimally intrusive retrofitting. See McArthuret al., “Plate Correction of Imaging Systems”, U.S. Pat. No. 5,392,119,Feb. 21, 1995; McArthur et al., “Plate Correction Technique for ImagingSystems”, U.S. Pat. No. 5,640,233, Jan. 26, 1995; McArthur et al.,“Single Plate Corrector for Stepper Lens Train”, U.S. Pat. No.5,929,991, Jul. 27, 1999; and Smith et al., “Apparatus Method ofMeasurement and Method of Data Analysis for Correction of OpticalSystems”, U.S. Pat. No. 5,978,085, Nov. 2, 1999; MacDonald et al.,“Imaging and Illumination System with Aspherization and AberrationCorrection by Phase Steps”, U.S. Pat. No. 5,136,413, Aug. 4, 1992. Alsoin-situ interferometer techniques (see A. Smith et al., “Apparatus,Method of Measurement and Method of Data Analysis for Correction ofOptical System”, U.S. Pat. No. 5,828,455, Oct. 27, 1998, “Apparatus,Method of Measurement and Method of Data Analysis for Correction ofOptical System”, supra), and source metrology techniques (see McArthuret al., “In-Situ Source Metrology Instrument and Method Use”, U.S. Pat.No. 6,356,345, Mar. 12, 2002) have been used to measure projectionimaging systems so that they may be improved or adjusted. In addition,recent advances in mask making may be utilized to compensate fortransmittance profiles.

In order to adjust a projection imaging system, it is helpful to be ableto quickly and reproducibly monitor the state of optical performance ofthe imaging system. In the above references, distortion and fieldcurvature data from exposed images are inferred, and used to designfigured optical surfaces that may be placed between the top lens and thereticle plane of the imaging system. Distortion and field curvaturecorrespond to the lowest order aberrations of an imaging system, namelyfield dependent tilt and lithographers-focus. Various techniques forin-situ measurement of distortion and field curvature have beendeveloped. See M. Dusa et al., “In-house Characterization Technique forSteppers” Optical/Laser Microlithography II, 1989, SPIE Vol. 1088, p.354; and D. Flagello, B. Geh entitled “Lithographic Lens Testing:Analysis of Measured Aerial Images, Interferometric Data and PhotoresistMeasurements”, SPIE Vol. 2726, p. 788, June 1996.

Techniques for the in-situ measurement of astigmatism have also beendeveloped. See T. Brunner et al., “Characterization and Setup Techniquesfor a 5×Stepper”, Optical/Laser Microlithography V, SPIE Vol. 663, 1986,p. 106; and J. Kirk, entitled “Astigmatism and Field Curvature fromPin-Bars”, Optical/Laser Microlithography IV, SPIE Vol. 1463, p. 282,Mar. 6, 1991.

Techniques for analyzing aerial images and aberrations have also beendeveloped. See A. Pfau et al., “A Two-Dimensional High-ResolutionStepper Image Monitor”, Optical/Laser Microlithography V, SPIE Vol.1674, Mar. 11, 1992, p. 182; E. L. Raab et al, “Analyzing the Deep-UVLens Aberrations Using Aerial Image and Latent Image Metrologies”,Optical/Laser Microlithography VII, SPIE Vol. 2197, Mar. 2, 1994, p.550; and C. Huang, “In-situ Optimization of an I-Line Optical ProjectionLens”, Optical/Laser Microlithography VIII, SPIE Vol. 2440, Feb. 22,1995, p. 735.

Use of these, and other, techniques have allowed for rapid, unintrusivecharacterization of lens aberrations (see U.S. Pat. Nos. 5,828,455 and5,978,985 both entitled “Apparatus, Method of Measurement and Method ofData Analysis for Correction of Optical System”, supra), illuminationsource (see U.S. Pat. No. 6,356,345 entitled “In-Situ Source MetrologyInstrument and Method of Use”, supra) and lens distortion (see A. Smithet al., “Method & Apparatus for Self-Referenced Projection LensDistortion Mapping”, U.S. Pat. No. 6,573,986, Jun. 2, 2003).

While these techniques are generally sufficient to characterize much ofexisting lithographic performance—especially for those lithographicexposure tools that are pushed near and beyond design specifications,both in pitch and resolution, it is also desirable to determine thelens, or imaging objective (IMO) transmission as a function of exitpupil transverse direction cosine (nx,ny)—at multiple field points—toallow for a more complete analysis and correction of thephotolithographic exposure system. The output of such measurements wouldbe the exit pupil transmission function T(nx,ny,xi,yi) at discretepoints ((xi,yi)i=1:N) across the projection image field. Once known,basic details of the IMO such as effective numerical aperture as afunction of field position, NA (xi,yi) and asymmetry of the numericalaperture, ΔNA (xi,yi) may be determined from T(nx,ny; xi,yi). In priorwork, a method for determining across pupil transmission variation, (oracross field pupil transmittance, APTV) using two-beam interference isdiscussed. See K. Sato et al., “Measurement of Transmittance Variationof Projection Lenses depending on the Light Paths using aGrating-Pinhole Mask”, SPIE Vol. 4346, 2001, pp. 379-386. Using thistechnique, a source illuminates a phase shift mask and is used to formimages in resist patterns. The pitch of the line/space patterns on thephase shift mask is used to sample the transmission across the pupil.Known limitations of this interference method include: sensitivity tosource uniformity; mask phase error; source sigma; and resistprocessing. See “Measurement of Transmittance Variation of ProjectionLenses Depending on the Light Paths using a Grating-Pinhole Mask, supra;and K. Sato et al., “Impact of Across Pupil Transmittance Variation inProjection Lenses on Fine Device Pattern Imaging”, SPIE, Vol. 5040,2003, pp. 33-44.

Thus, there is a need for more complete analysis and correction of aphotolithographic exposure systems and for improved illumination systemsand methods and apparatus to determine lens or imaging objective (IMO)transmission as a function of exit pupil transverse direction cosine(nx,ny) at multiple field points.

SUMMARY

In accordance with embodiments of the invention, techniques aredescribed for determining the exit pupil transmittance of a projectionimaging system. A lens or imaging objective (IMO) transmission isdetermined as a function of exit pupil transverse direction cosine(nx,ny) at multiple field points thereby providing a more completeanalysis and correction of a photolithographic exposure system.

The entrance pupil of a projection imaging system is uniformlyilluminated and the angular dependence of transmission through theimaging system as a function of exit pupil direction cosines isdetermined. Techniques for making a light condition that includes anin-situ illumination structure (ISIS), which is an optical structurethat can provide uniform illumination of the system's entrance pupil,are described.

An apparatus, method of measurement, and method of data analysis aredescribed for determining the state of the lens transmittance of anoptical projection system. The transmission of an imaging objective aretaken in-situ and without any significant alteration of the optical ormechanical setup. As such, monitoring and assessing a lens transmissionat a plurality of field points can be completed with only briefinterruptions of an optical tool's productive time. The techniquesdescribed can be used with photolithographic step and repeat reductionor non-reducing imaging systems (steppers), scanning imaging systems,fixed field step and repeat ablation systems, scanning ablation systems,or any other projection imaging or ablation system. Additionally,techniques for correcting transmission error, and improving bothlithographic simulation and semiconductor manufacturing are described.

Embodiments of a light conditioner for a projection imaging system thatoutputs a substantially uniform illumination with an angular extent thatis greater than an angular size of an entrance pupil of the projectionimaging system are described. The light conditioner includes an opticalinput and an optical output. The light conditioner receives light at theoptical input from a light source and outputs a substantially uniformillumination with an angular extent that is greater than an angular sizeof an entrance pupil of the projection imaging system. The lightconditioner can also include a reticle with a first surface and a secondsurface. There is at least one lens adjacent to the first surface of thereticle and a coating on the second surface of the reticle with at leastone opening in the coating, wherein an opening in the coatingcorresponds to one of the at least one lens. There is also an apertureplate with at least one opening, wherein an opening in the apertureplate corresponds to one of the at least one opening in the coating. Thelight conditioner can also include a transmission grating, a phasegrating, a phase diffuser, a transmission diffuser, or a polarizinggrating.

In another embodiment, the light conditioner includes a reticle with afirst surface and a second surface, wherein there is at least oneoptical opening on the first surface and a corresponding optical openingon the second surface. At least one lens, with a top surface and abottom surface, is adjacent to the optical opening on the first surfaceof the reticle. There is also an aperture plate with at least oneopening, wherein an opening in the aperture plate corresponds to anoptical opening on the second surface, wherein light received at the topof the at least one lens passes through the reticle and is outputthrough the at least one opening in the aperture plate as asubstantially uniform illumination with an angular extent that isgreater than an angular size of an entrance pupil of the projectionimaging system.

The lens top surface can include a transmission grating, a phasegrating, a phase diffuser, a transmission diffuser, a bulk diffuser, ora polarizing grating. The lens bottom surface can include a transmissiongrating, a phase grating, a phase diffuser, a transmission diffuser, abulk diffuser, or a polarizing grating. The optical opening on the firstsurface of the reticle can include a transmission grating, a phasegrating, a phase diffuser, a transmission diffuser, a bulk diffuser, ora polarizing grating. The optical opening on the second surface of thereticle can include a transmission grating, a phase grating, a phasediffuser, a transmission diffuser, a bulk diffuser, or a polarizinggrating.

In yet another embodiment, the light conditioner can include a reticleand a bulk diffuser. The light conditioner also includes an apertureplate with opening, wherein light passing through the reticle and thebulk diffuser is output through the at least one opening in the apertureplate as a substantially uniform illumination with an angular extentthat is greater than an angular size of an entrance pupil of theprojection imaging system. The bulk diffuser can be located between thereticle and the aperture plate, or adjacent to a reticle surface that isopposite the aperture plate. There can also be a lens adjacent to thereticle.

In another embodiment the light conditioner can include a reticle with afirst surface and a second surface, wherein there is at least oneoptical opening on the first surface and a corresponding optical openingon the second surface. There is at least one first optic adjacent to thefirst surface of the reticle and a second optic adjacent to the secondsurface of the reticle, wherein first and second optics are associatedand adjacent to the optical openings of the reticle.

There is also an aperture plate with at least one opening, wherein anopening in the aperture plate corresponds to an optical opening on thesecond surface of the reticle. Light received at the top of the firstoptic passes through the reticle and the second optic and is outputthrough the at least one opening in the aperture plate as asubstantially uniform illumination with an angular extent that isgreater than an angular size of an entrance pupil of the projectionimaging system. The first optic can include a transmission grating, aphase grating, a phase diffuser, a transmission diffuser, a bulkdiffuser, or a polarizing grating. The second optic can include atransmission grating, a phase grating, a phase diffuser, a transmissiondiffuser, a bulk diffuser, or a polarizing grating.

In still another embodiment, the light conditioner includes a firstreflective surface that includes a first optic and a second reflectivesurface that includes a second optic. There is also an aperture platewith an opening, wherein the opening in the aperture plate is associatedwith the first and second optics. Light incident upon the first opticreflects onto the second optic, reflects off the second optic andthrough the opening in the aperture plate as a substantially uniformillumination with an angular extent that is greater than an angular sizeof an entrance pupil of the projection imaging system. The first opticfurther comprises a transmission grating, a phase grating, a phasediffuser, a transmission diffuser, a bulk diffuser, or a polarizinggrating. The second optic further comprises a transmission grating, aphase grating, a phase diffuser, a transmission diffuser, a bulkdiffuser, or a polarizing grating.

An exit pupil transmittance of a projection imaging system may bedetermined by providing an illumination source with a substantiallyuniform illumination with an angular extent that is greater than anangular size of an entrance pupil of the projection imaging system. Arecording media is exposed with illumination from the illuminationsource that is emitted from an exit pupil of the projection imagingsystem. A transmission function of the projection imaging system isreconstructed from the exposed recording media.

The projection imaging system may be a stepper, a scanner, a scannerconfigured for immersion lithography, or a stepper configured forimmersion lithography. The recording media may be a photoresist, anelectronic device, or a CCD structure. In addition, the exit pupilnumerical aperture of the imaging system may be corrected. Thecorrection may be obtained by adjusting numerical aperture blades. Forexample, the aperture blades may be adjusted to represent approximatelythe average numerical aperture of all field points measured. Theaperture blades may also be elliptically configured. The correction mayinclude adjusting a position of the numerical aperture. For example, thenumerical aperture position may be adjusted to represent an averagenumerical aperture for all field points measured. A transmission-errorof the projection imaging system may also be corrected. For example, thecorrection may include placement of a gray-level pupil filter into apupil plane.

Techniques described may also be used to determine a reticle sidetelecentricity of a projection imaging system. An illumination sourcewith a substantially uniform illumination with an angular extent that isgreater than an angular size of an entrance pupil of the projectionimaging system can be provided, then exposing a recording media withillumination from the illumination source that is emitted from an exitpupil of the projection imaging system. A transmission function of theprojection imaging system as a function of field position from theexposed recording media is reconstructed, then a difference between acenter of a reference frame and a center of the exposed exit pupil foreach field point is determined and individual components of reticle sidetelecentricity are calculated. The components can then be fitted to apolynomial function.

The projection imaging system may be a stepper, a scanner, a scannerconfigured for immersion lithography, or a stepper configured forimmersion lithography. Also, the recording media may be a photoresist,an electronic device, or a CCD structure. In addition, exposing therecording media may include multiple sub-exposures.

Techniques described can be used in manufacturing a photolithographicchip mask, or manufacturing of semiconductor chips, or devices. Anillumination source can be provided that has a substantially uniformillumination with an angular extent that is greater. than an angularsize of an entrance pupil of a projection imaging system, then exposinga recording media with illumination from the illumination source that isemitted from an exit pupil of the projection imaging system. Atransmission function of the projection imaging system is reconstructedfrom the exposed recording media, then adjusting an aperture in theprojection imaging system in accordance with the reconstructedtransmission profile. After the adjustment a desired mask work reticlemay be projected in the projection imaging system. The adjustment mayinclude adjusting the aperture position, or the aperture shape, or anintensity distribution. In addition, exposing the recording media mayinclude multiple sub-exposures.

Techniques described can also be used in controlling a projectionimaging system. For example, a controller may be used to adjust theaperture.

Other features and advantages of the present invention should beapparent from the following description of exemplary embodiments, whichillustrate, by way of example, aspects of the invention.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic of a lithographic stepper or step and scanmachine, that includes lens or imaging objective that can have theirtransmission as a function of exit pupil transverse direction cosine atmultiple field points determined.

FIG. 2 is a schematic illustrating a portion of a reticle with amultiplicity of lens elements and field, or aperture, openingscorresponding to separate and distinguishable field points.

FIG. 3 is a ray trace for an exemplary in-situ illumination structure(ISIS).

FIG. 4 is a schematic of another embodiment of ISIS.

FIG. 5 is a diagram illustrating an exemplary checkerboard transmissiongrating of period GP.

FIG. 6 is a diagram illustrating a simple two-level (0° and 180°)grating.

FIG. 7 is a diagram illustrating a portion of a two-level (0° and 180°)phase diffuser (PD) as might be fabricated using standard mask makinglithography.

FIG. 8 is a diagram illustrating another exemplary phase diffuser, inthis instance consisting of a multiplicity (>2) of phase levels.

FIG. 9 is a diagram of cross section AA in FIG. 8 as a phase Φvariation.

FIG. 10 is a diagram illustrating an exemplary transmission diffuser(TD).

FIG. 11 is a schematic diagram illustrating seven different variationsof an ISIS.

FIG. 12 is a schematic illustrating an embodiment of an multi-fieldin-situ illumination structure (MFISIS) where the ISIS consists of abulk diffuser.

FIG. 13 is a schematic diagram illustrating seven additional variationsof ISIS.

FIG. 14 is a schematic diagram illustrating a fifth embodiment of aMFISIS.

FIG. 15 is a schematic diagram illustrating a sixth embodiment of aMFISIS.

FIG. 16 is a schematic diagram illustrating a seventh embodiment of aMFISIS.

FIG. 17 is a block diagram illustrating an embodiment of a MFSIS.

FIG. 18 is a block diagram illustrating another embodiment of a MFISIS.

FIG. 19 is a block diagram illustrating a first variation of a ninthembodiment of a MFISIS.

FIG. 20 is a block diagram illustrating a second variation of the ninthembodiment of a MFISIS.

FIG. 21 is a block diagram illustrating a third variation of the ninthembodiment of a MFISIS.

FIG. 22 is a schematic diagram illustrating a cross-section on an ISISin a 10^(th) embodiment.

FIG. 23 is a schematic diagram illustrating a cross section on an ISISin an 11^(th) embodiment.

FIG. 24 is a flow diagram illustrating an embodiment for measuring theexit pupil transmission using silicon wafers coated with a suitablerecording media.

FIG. 25 is a table illustrating a Zernike polynomial expansion of thelogarithm of the exit pupil transmittance.

FIG. 26 is a flow chart illustrating an embodiment for measuring theexit pupil transmission using an electronic sensor.

FIG. 27 is a block diagram of an embodiment of an ISIS that includes asub-resolution grating.

FIG. 28 is a block diagram of another embodiment of an ISIS thatincludes a sub-resolution grating.

FIG. 29 is a flow diagram illustrating an embodiment for thedetermination of reticle side telecentricity (RSTC) as a function offield position.

DETAILED DESCRIPTION

Exemplary methods and apparatus for improved illumination systems andfor determining lens or imaging objective (IMO) transmission as afunction of exit pupil transverse direction cosine (nx,ny) at multiplefield points are described. Techniques of determining an in-situtransmission map can be used to determine the exit pupil transmittancethereby allowing a more complete analysis of a projection imagingsystem, such as a photolithographic exposure system. A more completeanalysis of a projection imaging system can be used to improve theperformance of the imaging system. For example, the analysis can be usedto develop improved corrective optics for use in the imaging system.Techniques described can be applied to steppers and scanners with theadded ability to account for variations in source uniformity. Improvedanalysis of the imaging system using in-situ transmission map techniquesgenerate data that may also be used to help determine opportunities forlens correction as a function of time and improved chip fabrication. Inaddition, data about the exit pupil transmittance may be utilized incommercially available lithographic modeling programs such as PROLITH™or Analysis Characterization Engine (ACE)™ for predictive analysis.

FIG. 1, is a schematic of a lithographic stepper or step and scan(scanner) machine, MA, that includes lens or imaging objective (IMO) forwhich transmission as a function of exit pupil transverse directioncosine at multiple field points can be determined. As shown in FIG. 1,the MA includes a light source S, a reticle stage RS, imaging objectiveIMO and wafer stage WS. The light source can include an illuminationsource Si that outputs illumination light IL and an illuminationconditioning S2 that conditions the light IL. The IMO includes an upperimaging objective IMOI, a lower imaging objective IMO2, and an aperturestop AS. The illumination light IL is conditioned before entering the ASsuch that that the angular extent of the illumination source is greaterthan the angular size of the entrance pupil of the imaging system. Thischaracteristic is also referred to as having a sigma greater than 1(σ>1). Various techniques may be used to produce light entering IMO witha sigma greater than 1. For example, as described further below, anin-situ illumination structure (ISIS), or multiple ISIS, can be locatedin the optical path between the illumination source S1 and the aperturestop, AS, thereby forming a multiple field in-situ illuminationstructure (MFISIS). Embodiments are described below illustrating theISIS located at different locations in the optical path. Acharacteristic of an MFISIS is that it conditions an illumination sourceso that it has a sigma greater than 1 (σ>1).

As shown in FIG. 1, the Aperture Stop, AS, limits the maximum angle(numerical aperture or NA) of light ultimately incident at a wafer (notshown) located on the wafer stage, WS. An observer located at (anyparticular field point) WS and looking back through the lower portion(IM02) of the imaging objective at AS would ideally see a disc with acertain angular subtense (NA=sine of half angle); this is the exit pupilthe observer sees. An observer located at the Reticle Stage RS, lookingat AS, observes the entrance pupil. If the entrance pupil is uniformlyilluminated at a particular field point using an ISIS, and the lightintensity coming from the exit pupil,

${\frac{I}{o}\left( {{nx},{ny}} \right)},$

is observed, then the transmission as a function of angle is, to withina multiplicative constant, equal to:

$\begin{matrix}{{T\left( {{nx},{ny}} \right)} = {\frac{I}{o}\left( {{nx},{ny}} \right)*\sqrt{\frac{1 - {nx}^{2} - {ny}^{2}}{1 - {{nx}^{2}/M^{2}} - {{ny}^{2}/M^{2}}}}}} & \left( {{Equation}\mspace{14mu} 1} \right)\end{matrix}$

Where

$\frac{I}{o}\left( {{nx},{ny}} \right)$

is the radiant intensity; power per steradian (or just energy per solidangle), nx and ny represent the transverse direction cosines (on thewafer side) for a particular energy bundle, and M=reductionmagnification ratio (4 or 5 typically).

So if an ISIS is used, and

$\frac{I}{o}\left( {{\overset{\_}{n}x},{\overset{\_}{n}y}} \right)$

is measured, or otherwise determined, the angular dependence of thetransmission as a function of exit pupil direction cosines can bedetermined.

First Embodiment MFISIS Apparatus for Uniform Illumination of theEntrance Pupil

FIG. 2 is a schematic illustrating a portion of a reticle stage with amultiplicity of lens elements L and field, or aperture, openings Ocorresponding to separate and distinguishable field points. Each lenselement L is positioned over the aperture opening O, which is a smallhole with a radius R in the aperture plate AP. For any particular fieldopening on the imaging plane, portions of the source (FIG. 3) are imageddown through both the chrome opening on the backside of the reticle andthrough a small hole (O) in the aperture plate. Ray bundles leaving theaperture plate spread rapidly and uniformly illuminate the entrancepupil of the optical system. The lens, hole, and aperture arecollectively referred to as an in-situ illumination structure, or ISISone of which is indicated in FIG. 2 by dashed lines. Illuminationpassing through the ISIS provides uniform illumination of the imagingsystem's entrance pupil. For any particular field point, thecorresponding ISIS structure samples the entire source and superimposesthe resulting illumination profiles uniformly over the entrance pupil.The resulting irradiance profile passes through an imaging objective ofthe imaging system (IMO in FIG. 1) and forms a (field dependent) imageof the aperture stop in the plane of the wafer stage (WS in FIG. 1). Foreach image (field point), measurement of the radiant intensity as afunction of the exit pupil direction cosine (for example, an intensityring in the image) allows for the construction of a transmissionfunction for the exit pupil (see, for example, Equation 11, A. Smith etal., “Apparatus and Method for High Resolution In-Situ IlluminationSource Measurement in Projection Imaging Systems”, U.S. Publication No.2005-0237512).

The exemplary multiple field in-situ illumination structure (MFISIS)illustrated in FIG. 2 includes a plurality of in-situ illuminationstructures (ISIS) packaged in a reticle/pellicle envelope. In theembodiment of FIG. 2, a single ISIS includes a lens, L, with nominalfocus at the aperture plate opening, O, and chrome opening, CO, thatlets light pass through reticle face, RF. Lens, L, is shown as a pianoconvex lens but it can take other forms, for example, an aspheric tominimize aberrations that cause lens, L, to focus different incidentangles of incident light, IL, at different locations at aperture plate,AP.

As shown in FIG. 2, lens L is supported by lens fixture LF to beadjacent to a first surface of reticle. In the example illustrated inFIG. 2, a lens fixture, LF, holds the lens adjacent to the reticle. Forexample, the lens may be touching the reticle, or there may be a gapbetween the bottom of the lens and the reticle. The lens fixture hasoptical openings that allow light to pass through the lens, lensfixture, reticle and exit through an associated optical opening in achrome coating on the second, or bottom surface of the reticle. Theportions of the lens fixture that do not include optical opens block, orprevent such as reflect or absorb, light thereby preventing the lightfrom passing through the reticle. In another embodiment, the first ortop surface of the reticle may be covered with a coating with opticalopenings and lens may be affixed adjacent to the optical openings.

FIG. 3 is a ray trace diagram for an exemplary ISIS structure such asillustrated in FIG. 2. Examples of physical requirements (opticalelements, hole sizes, positions, and shapes) for each portion of theISIS structure, as well as exemplary methods of construction for thereticle are described further below.

An exemplary construction of an ISIS using a piano convex lens is:

λ=248.4 nm

RL=lens radii of curvature=4.8 mm

LT=lens center thickness=2.1 mm

Reticle thickness=3.81 mm

ZAP=5 mm

DAP=0.06 mm

Reticle/lens material=fused silica.

The intensity at the wafer plane can be shown to be:

$\begin{matrix}{{I_{waf}\left\lbrack {\frac{1}{M}\left( {{\overset{\_}{x}}_{r} - {\overset{\_}{x}}_{c}} \right)} \right\rbrack} = {\int{\frac{d^{2}n_{r}*}{\sqrt{1 - n_{w}^{2}}}\frac{E^{waf}}{{o}\; {\overset{\_}{n}}_{w}}\left( {\overset{\_}{n}w} \right)*{{Htop}\left( {{{\overset{\_}{n}}_{r} - {\overset{\_}{n}}_{ch}} < E} \right)}*{T\left( {\frac{M}{n_{i}}\left( {{\overset{\_}{n}}_{r} - {\overset{\_}{n}}_{TEL}} \right)} \right)}}}} & \left( {{Equation}\mspace{14mu} 2} \right)\end{matrix}$

where:

I_(waf)=observed intensity at the wafer plane

M=system reduction magnification

x _(r)=transverse (x,y) position where ray strikes reticle face (FIG. 3)

x _(oa)=optical axis position for a given lens at a given field point

x _(c)=nominal field point center=ideal lens transverse position

n _(r)=ray transverse direction cosine after leaving reticle face (FIG.3)

n _(w)=ray transverse direction cosine at wafer (FIG. 3)

${\frac{E^{waf}}{o_{\overset{\_}{n}w}}\left( {\overset{\_}{n}w} \right)} = {{radiant}\mspace{14mu} {intensity}\mspace{14mu} {at}\mspace{14mu} {the}\mspace{14mu} {wafer}\mspace{14mu} {as}\mspace{14mu} a\mspace{14mu} {function}\mspace{14mu} {of}\mspace{14mu} {the}\mspace{14mu} {wafer}\mspace{14mu} {direction}\mspace{14mu} {cosine}}$

Htop( )=top hat function=(1/0) depending on the inequality expressedwithin parenthesis (vide infra)

T( )=exit pupil transmission

n _(TEL)=reticle or entrance pupil machine nontelecentricity

n_(i)=wafer side immersion medium refractive index (=1 for air)

n _(ch)=pinhole chief ray transverse direction cosine (FIG. 3)

-   -   =( x _(ph)− x _(r))/√{square root over (ZAP²+( x _(ph)− x        _(r))²)}

x _(ph)=transverse location of pinhole center (FIG. 3)

ZAP=aperture plate standoff distance.

For a circular pinhole opening of radius R_(ph), when light is incidentwith chief ray (FIG. 3) n _(ch)≠0, the effective shape will be anellipse with major axis perpendicular to n _(ch) and semi-major angularsize R_(ph)√{square root over (1− n _(ch) ²)}/ZAP and semi-minor angularsize R_(ph)(1− n _(ch) ²)/ZAP. The center of this ellipse is at n _(ch).All rays emanating from point x _(r) (FIG. 3) on the reticle withtransverse direction cosines within this ellipse pass through thepinhole. This is what is meant by “ n _(R)− n _(ch)<E”.

The wafer transverse direction cosine appearing in Equation 2 is givenby the formula (mixed characteristic):

$\begin{matrix}{{{\overset{\_}{n}}_{w}\left( {{\overset{\_}{x}}_{R},{\overset{\_}{n}}_{r}} \right)} = {\frac{M}{n_{i}}\begin{bmatrix}{{{A\left( {U,V,W} \right)}\left( {{\overset{\_}{X}}_{r} - {\overset{\_}{X}{oa}}} \right)} +} \\{{B\left( {U,V,W} \right)\left( {{\overset{\_}{n}}_{r} + {\overset{\_}{n}}_{j}} \right)} - {\overset{\_}{n}}_{TEL}}\end{bmatrix}}} & \left( {{Equation}\mspace{14mu} 3} \right)\end{matrix}$

where:U=√{square root over (( X _(r)− X _(oa))o( X _(r)− X _(oa)))}V=√{square root over ( n _(r)o n _(r))}W=( X _(r)− X _(oa))o n _(r)o=2-dimensional vector dot productn _(j)=Grating order; transverse direction cosineand A, B are functions of the indicated arguments that depend on theISIS lens (FIG. 3) design and position. A and B can be computed as powerseries in the indicated arguments.

Now, to the extent that the source

$\frac{E^{waf}}{o_{\overset{\_}{n}w}}$

in Equation 2 is constant over the range of values (Equation 3), ittakes on, we can replace it by a constant in Equation 2. We canapproximately move the factor 1/√{square root over (1−n_(w) ²)} outsidethe integral since it varies little over the pinhole opening and thenEquation 2 becomes:

$\begin{matrix}{{\left. {I_{waf}\left\lbrack {\frac{1}{M}\left( {{\overset{\_}{x}}_{r} - {\overset{\_}{x}}_{c}} \right)} \right\rbrack} \right.\sim\frac{1}{\sqrt{1 - {\overset{\_}{n}}_{w,c}^{2}}}}{\langle T\rangle}\left( {\frac{M}{n_{i}}\left( {{\overset{\_}{n}}_{r} - {\overset{\_}{n}}_{TEL}} \right)} \right)} & \left( {{Equation}\mspace{14mu} 4} \right)\end{matrix}$

where;n _(w,c)= n _(w)( X _(r), n _(ch)) in Equation 3<T>=transmission convolved with pinhole

This is equivalent to Equation 1 if we express I_(waf) in terms of theradiant intensity per solid angle

$\left( \frac{I}{o} \right)$

reaching the wafer.

Second Embodiment MFISIS

FIG. 4 is a schematic showing another embodiment of ISIS. Illustrated inFIG. 4 are three different variations of ISIS. This embodiment issimilar to the first embodiment with the exception that structures onreticle face, RF, replace the clear, unobstructed and unmodulated chromeopenings, CO. The first variation on the left shows incident light rayR1 striking transmission grating, TG, and being split into multipleorders, some of which pass through opening, O, others intercepted by AP.Ray R2 at a different incident angle than R1 also strikes, TG, isdiffracted into multiple orders, some of which pass through O. A benefitof TG is to ameliorate the effect of somewhat inhomogeneous illuminationsources (non-uniform intensity) and thereby allow a larger opening, O,to be utilized. Larger O means less exposure time required forcharacterizing machine MA. Equation 2 can be modified to account forrays scattered by the transmission grating by summing the power for eachdiffracted order separately.

$\begin{matrix}{\frac{1}{\sqrt{1 - n_{w}^{2}}}\frac{E^{waf}}{o_{\overset{\_}{n}w}}\left( {\overset{\_}{n}}_{w} \right)\mspace{14mu} {is}\mspace{14mu} {replaced}\mspace{14mu} {by}\mspace{14mu} {\sum\limits_{j}{\frac{F_{j}}{\sqrt{1 - n_{w,j}^{2}}}\frac{E^{waf}}{o_{nw}}\left( {\overset{\_}{n}}_{w,j} \right)}}} & {{In}\mspace{14mu} {Equation}\mspace{14mu} 2}\end{matrix}$

where:F_(j)=fraction of power scattered from n→ n+ n _(j) by gratingn _(j)=grating order or scattering transverse direction cosine.n _(w,j)= n _(w)( x _(r), n _(r)+ n _(j)) in Equation 3

FIG. 5 is a diagram illustrating an exemplary checkerboard transmissiongrating of period GP. If a source or class of sources consist of ‘lumps’at angular spacing Δθ (on reticle side), then picking GP from amongst:

${\frac{\lambda}{GP} = \frac{\Delta \; \theta}{2}},{\frac{3}{2}\Delta \; \theta},{\frac{5}{2}\Delta \; \theta},\ldots$

will minimize source inhomogeneity.

So that the TG does not print through (appear as a modulated light anddark pattern at the wafer) we need

$\begin{matrix}{{GP} < \frac{2*\lambda}{D_{ap}/Z_{ap}}} & \left( {{Equation}\mspace{14mu} 5} \right)\end{matrix}$

The middle ISIS of FIG. 4 is a second variation. Instead of a TG, aphase grating (PG) is used. PGs generally have higher diffractionefficiencies and good designs that spread out energy evenly in loworders exist (see WH. Lee, “High Efficiency Multiple Beam Gradings”,Applied Optics, Vol. 18, No. 13, July 1979, pp. 2152-2158). FIG. 6 is adiagram illustrating a simple two-level (0° and 180°) grating. Anadvantage of using a phase grating (two or more phase levels) is gratingperiod constraint of Equation 5 need not apply (print through is not anissue).

The ISIS on the right side of FIG. 4 uses a phase diffuser (PD) to breakup the incident light into a large (infinite) number of orders. Thisprovides for maximum homogenization of incident light, IL. FIG. 7 is adiagram illustrating a portion of a two-level (0° and 180°) PD as mightbe fabricated using standard mask making lithography.

FIG. 8 is a diagram illustrating another exemplary phase diffuser, inthis instance consisting of a multiplicity (>2) of phase levels. Beingdifficult to represent in a drawing, it is represented by the wavy linesWL1, WL2, etc. Cross section AA in FIG. 8 is shown in FIG. 9 as a phaseΦ variation. This variation will generally be different for differentsections of the phase diffuser. The scattering properties of the phasediffuser are statistically represented by the auto-correlation function(R) of the phase Φ as:

Φ( x )Φ( y )

=R( x− y )  (Equation 6)

where:x, y=transverse position< >=ensemble or statistical average

Equation 6 applies to phase diffusers that are translationallyinvariant, e.g., phase diffusers whose average scattering distributionover small spatial patches is the same at different locations on thediffuser face. Given R, we can compute the angular distribution ofscattered light by standard means (“Statistical Optics”, J. W. Goodman,1st ed, Pages 374-381). Though shown in FIG. 9 as a continuous phase, itcould also be a number of discrete phase levels depending on the methodof manufacture (see Catanzaro et al., “Multilayer E-Beam Lithography onNonconducting Substrates”, U.S. Pat. No. 5,733,708, Mar. 31, 1998).

A fourth variation, not shown, utilizes a transmission diffuser (TD), inplace of TG in the first variation illustrated in FIG. 4. FIG. 10 is adiagram illustrating an exemplary. TD. To prevent print through, thecharacteristic size S for each sub-feature needs to satisfy:

$\begin{matrix}{S < \frac{\lambda}{D_{ap}Z_{ap}}} & \left( {{Equation}\mspace{14mu} 7} \right)\end{matrix}$

MFISIS Third Embodiment

FIG. 11 is a schematic diagram illustrating seven different variationsof an ISIS. This is similar to the first embodiment, illustrated in FIG.2, regarding lens, L, only now we distribute the four basic scatteringstructures described in the second embodiment (TG, PG, PD, TD) on someor all of the four surfaces: reticle face (RF), reticle top (RT), lensbottom (LB), or lens top (LT). There are 4⁴=256 possible variations;four of which were covered in the second embodiment, leaving 252 newvariations of which only seven are shown. The advantage of placingscattering structures TG, PG, PD, TD on surfaces other than the RF isthat the possibility of print through (restriction of Equations 5 and 7)is reduced, or removed.

Fourth Embodiment MFISIS

FIG. 12 is a schematic illustrating an embodiment of an MFISIS where theISIS consists of a bulk diffuser BD held transversely in place by acontainment fixture CF capped on the top by reticle R, and at the bottomby transparent aperture plate TAP. In the example illustrated, the TAPis transparent except for chrome coating, CC, that contains openings, O.Incident light, IL, strikes BD and because of the random size, shape,orientation and local packing fraction of the individual particlesmaking up the BD, it performs a sort of optical random walk that notonly changes the incident direction but also creates numerous additionallight rays that emerge from BD as diffused light, DL.

The bulk diffuser may be made of different types of material. Forexample, quartz crystal powder (see “Reade Advanced Materials Offers:Quartz Crystal Powder, Reade Advanced Materials website, pp. 1-4, 2004)or simply ground up, UV grade synthetic fused silica with scale, orsize, ss satisfying:

ss<0.03(Z _(ap) −Z _(A))=0.03*containment fixture height  (Equation 8)

is readily obtained as bulk diffuser, BD. At longer wavelengths,ordinary ground glass could be used.

To insure illumination of the entrance pupil, there is also theconstraint:

$\begin{matrix}{N*{\frac{{TS}/3}{ZA}/\frac{NA}{M}}} & \left( {{Equation}\mspace{14mu} 9} \right)\end{matrix}$

where:

N=Refractive index of TAP

TS=transverse size of individual containment cells

ZA=TAP thickness

NA=numerical aperture of exit pupil

M=machine reduction magnification (4 or 5 typically)

FIG. 13 is a schematic diagram illustrating seven additional variationsof ISIS labeled from left to right as V2:V8. The variations V2:V8 allutilize transparent aperture plate, TAP, which contains the definingopening, O. In variation V2, opening, O, is located on the top side ofTAP, next to BD. Variation V3 is identical to the arrangement of FIG. 12except lens, L, is used to concentrate additional light on BD. The bulkdiffuser (BD) or a discrete diffuser may be in contact or closeproximity to an optical opening on reticle. Variation V4 is the same asV2 only additional lens, L, concentrates light on BD. Variation V5consists of BD within CF on the reticle top, RT, and covered bytransparent cover plate, TCP. Opening, O, is located on the top side ofthe TAP. Variation V6 is like V5 only opening is located on TAP bottom.Variation V7 consists of bulk diffuser held in place on the reticle top,RT, by containment fixture and transparent cover plate but opening, O,is now located at reticle top, RT. Variation V8 is like variation V6only now instead of TAP containing opening, O, metal aperture plate, AP,contains opening, O.

Fifth Embodiment of MFISIS

FIG. 14 is a schematic diagram illustrating a fifth embodiment of aMFISIS. In this embodiment the MFISIS includes an ISIS made up ofdiscrete diffuser elements, DDE, attached to diffuser fixture plate,DFP, which is attached to the reticle top, RT. The aperture plate, AP,stands off from the reticle face, RF, and contains openings, O. Theaction of DDE is shown on the left ISIS of FIG. 14 where incident light,IL, is broken up into multiple rays moving in diverse directions, DL.Discrete diffusion elements can be of various forms (see A. Smith etal., “High Power Masks & Methods for Manufacturing Same”, U.S. Pat. No.5,501,925, Mar. 26, 1996, granular chemical etching, etc.).

Sixth Embodiment of MFISIS

FIG. 15 is a schematic diagram illustrating a sixth embodiment of aMFISIS. In this embodiment, the MFISIS includes four separate variationsof the ISIS (VA1:VA4) depicted. This embodiment is very similar to thesecond embodiment, illustrated in FIG. 4, but instead of a lens, L,focusing on an opening, O, in an aperture plate, AP, it has beenreplaced with a Fresnel zone plate, FZP, that is integral to the reticletop, RT, that focuses on an opening, O. The Fresnel zone plate can bedesigned to optimally focus on opening, O, with zero sphericalaberration. By making multi-level structures, it can also have highefficiency. The four variations show TG, PG, PD and TD applied to thereticle face, RF. Advantages and design considerations are discussedunder the second embodiment. An additional embodiment (not shown)consists of an FZP focused on aperture plate opening, O, but clear glass(no TG, PG, PD or TD) on reticle face, RF.

Seventh Embodiment of MFISIS

FIG. 16 is a schematic diagram illustrating a seventh embodiment of aMFISIS. In this embodiment, the MFISIS is for use in a reflectivesystem. Incident light, IL, strikes fold mirror replacement, FMR, thatconsists of a multiplicity of Fresnel zone plates, FZP; each FZPfocusing on a separate opening, O, in aperture plate, AP. After strikingFMR, light is incident on reticle, R, which contains separatetransmission grating elements, TG, for each ISIS. The function of TG isas in the first embodiment, to further homogenize the incident lightsource. Finally, aperture plate, AP, containing openings, O, is placedin the beam path. This MFISIS consists of three physically discrete andseparated elements, FMR, R, and AP.

Eighth Embodiment of MFISIS

To assist in understanding the following discussion it may be helpful tobriefly review FIG. 1. FIG. 1 is a schematic of a lithographicprojection machine, MA (stepper or scanner). The Light source, S, isbroken into two portions Si and S2. Si may include the primary lightsource (laser or lamp) and some beam forming optics while S2 may includethe balance of beam forming optics. Next, the reticle stage, RS, holdsand moves the reticle, R, (not shown). Next is the imaging objective,IMO, that consists of pre-aperture stop optics, IMOI, the physicalaperture stop, AS, and post-aperture stop optics 1M02. Finally, thewafer stage, WS, holds the wafer (not shown) for photo exposure.

FIG. 17 is a block diagram illustrating an embodiment of a MFSIS. Asshown in FIG. 16, on this embodiment, first variation, a MFISIS includesa discrete diffuser DDE placed between sections SI and S2 of the sourceoptics and a reticle, R, containing transparent openings, 0, inotherwise chrome coated (CC) reticle top. The discrete diffuser DDE,creates diffused light, DL, from incident light, IL, that evenly fillsthe entrance pupil of machine, MA.

FIG. 18 is a block diagram illustrating another embodiment of a MFISIS.As shown in FIG. 18, in this embodiment, second variation of the MFISISin which the DDE is placed between sections SI and S2 of a source, andreticle stage, RS, holds reticle, R, which has aperture plate, AP, withopenings, 0, attached to reticle face, RF.

Ninth Embodiment of MFISIS

FIG. 19 is a block diagram illustrating a first variation of a ninthembodiment of a MFISIS. In this embodiment, the MFISIS includes areticle, R, with openings, 0, in reticle top, RT, that is otherwisechrome coated (CC). A source, S, is set to a diagnostic illuminationcondition where the angular extent of the source is set to be largerthan the angular size of the entrance pupil. This is indicated as thecommand in the bannered box “σ>1”. This is called a diagnostic settingsince the product (chips) are not run at this class of illuminationconditions.

FIG. 20 is a block diagram illustrating a second variation of the ninthembodiment of a MFISIS where aperture plate, AP, is placed at a discretelocation between sources and reticle stage, RS. AP contains openings, O.Source, S, is run at the diagnostic setting “σ>1”, again indicated bythe bannered box. This is a useful configuration in reflective systemswhere the only addition would be a blank, uniformly reflective (brightfield) reticle placed in reticle stage, RS.

FIG. 21 is a block diagram illustrating a third variation of the ninthembodiment of a MFISIS. In this variation, the aperture plate, AP,containing openings, 0, is placed between reticle stage, RS, and thefirst portion of imaging objective IMO1. Source, S, is run at “σ>1”diagnostic mode. This configuration can be used in reflective systemswhere the only addition would be a blank, uniformly reflective (brightfield) reticle placed in reticle stage, RS. One method for achievingthis is to mechanically scan or nutate a smaller (σ<1) source in angleduring the course of an exposure or as a sequence of sub-exposures atdifferent angles.

10th Embodiment

FIG. 22 is a schematic diagram illustrating a cross-section on an ISISin a 10th embodiment. As shown in FIG. 22, a ball lens, BL, is locatedbelow reticle face, RF, approximately focuses onto opening, 0, inaperture plate, AP. An advantage of this arrangement is that because ofshort focal length of ball lens, BL, compared to aperture plate standoff(zap), there is a large source grasp. One example using the followingconstructional parameters—

Wavelength =   248 mm ball lens diameter =    1 mm ball lens material =UV grade fused silica pinhole diameter in aperture plate (diameter of 0)= 0.155 mm zap = 4.923 mm ball lens standoff from aperture plate (BLSOin FIG. 22) = 0.192 mmhas a source grasp (i.e. region in solid angle space withtransmission=1) numerical aperture (NA)>0.1 on the reticle side. Thismeans a source with smaller NA will be completely passed by this ISISresulting in uniform and bright illumination of the machine exit pupil.Resolution of this device corresponds to an NA on the wafer side ofNAres˜0.063.

For use with an electronic sensor, this high brightness helps reducenoise and exposure time however if photoresist coated wafers areutilized as the recording means then we could reduce the transmission ofISIS by one of a number of means. One mechanism involves coating reticleback, RB, with a partially reflecting or partially absorbing coating(>˜90-98% attenuation). Another mechanism involves utilizing attenuatedphase shift mask material (˜6% transmission) on reticle face, RF.

To increase the resolution (decrease NAres above) we merely reducediameter of 0, however this results in a smaller source grasp. This canbe compensated for by running light source S at a smaller coherence orsigma value (this decreases NAs) or by including grating structures onreticle face, RF, or reticle back, RB (vide supra).

11th Embodiment

FIG. 23 is a schematic diagram illustrating a cross section on an ISISin an 11′h embodiment. In this embodiment, the ball lens, BL, is locatedabove reticle back, RB, approximately focuses onto opening, 0, inaperture plate, AP (also on RB). Aperture plate standoff (zap) is nowthe distance from RF to AP. One example uses the followingconstructional parameters—

Wavelength =   248 nm ball lens diameter =  1.8 mm ball lens material =UV grade fused silica pinhole diameter in aperture plate (diameter of 0)= 0.155 mm zap = 4.923 mm ball lens standoff from aperture plate (BLSOin FIG. 23) = 0.400 mm

Again for use with an electronic sensor, high brightness helps reducenoise and exposure time however if photoresist coated wafers areutilized as the recording means then we could reduce the transmission ofISIS, as discussed in relation to FIG. 22.

Again, to increase the resolution, reduce diameter of 0 resulting in asmaller source grasp. Again, this can be compensated for by running thelight source S at a smaller coherence or sigma value (this decreasesNAs) or by including grating structures on the reticle face, RF, orreticle back, RB, as discussed in relation to FIG. 22.

In the examples illustrated in FIGS. 22 and 23, a ball lens was used. Itshould be appreciated that any other type of lens may be used. Likewise,the examples in FIGS. 22 and 23 illustrate a reticle, but it should beappreciated that a grating could also be used.

Additional Embodiments

High NA lithography: The methods for the preferred embodiment can beused for lithographic systems operating with effective numericalapertures >1 (immersion or other lithography). For such cases, it isnecessary to correct the transmission function (Equation 1) by adjustingthe direction cosine on the wafer side by the index of refraction of thecoupling material and reticle-side direction cosine. For example, usingwater as the immersion fluid,

${\overset{\_}{n}r} = {\frac{ni}{M}*\overset{\_}{n}w}$

where; nr=the direction cosine of a ray on the reticle side, nw=thegeometric direction cosine on the wafer side, ni=index of refraction ofthe immersion fluid at the exposure wavelength (ni˜1.44 for water at 193nm), and M is the system reduction magnification. Using nw for nx and nyin Equation 1 we-can express this as:

$\begin{matrix}{{T\left( {\overset{\_}{n}w} \right)} = {\frac{I}{o}\left( {\overset{\_}{n}w} \right)*\sqrt{\frac{1({nw})^{2}}{1 - {\left( {{ni}/M} \right)^{2}*\left( {nw}^{2} \right)}}}}} & \left( {{Equation}\mspace{14mu} 10} \right)\end{matrix}$

Hence, we would have to observe the energy distribution in the immersionmedia using a suitable recording media presented below. Note, Equation 2shows the general relationship for any media.

Process for Measuring T (nx, ny) First Embodiment

FIG. 24 is a flow diagram illustrating an embodiment for measuring theexit pupil transmission using silicon wafers coated with a suitablerecording media. For example, when recording the source images inphotoresist on a wafer, the process flow of FIG. 24 may be used. Flowbegins in block 2402 where an MFISIS, as described herein, is providedand loaded onto the machine. Flow continues to block 2404 where aresist-coated substrate (wafer) is provided and loaded on the machine.Then, in block 2406, the substrate is exposed at multiple, increasingexposure doses at discretely separated image fields on a wafer (oradditional wafers). See, for example, page 3 of “Examples ofIllumination Source Effects on Imaging Performance” by A. J. de Ruyteret al., in ARCH Chemicals Microlithography Symposium, pp. 1-8, 2003.Flow continues to block 2408 and the substrate is then developed. Thenin block 2410 the exposed images are photographed (multiple photographsfor each field point) one by one (dose by dose). From these images andknowledge of the exposure dose sequence, the “raw” intensity contours of

$\frac{I}{o}\left( {{\overset{\_}{n}x},{\overset{\_}{n}y}} \right)$

are obtained. Then in block 2414, these intensity contours arecomputationally overlapped to reconstruct the normalized radiantintensity as a function of nx and ny for all field points yielding T(nx, ny) to within a constant, multiplicative factor:

$\begin{matrix}{{T\left( {{nx},{ny}} \right)} = {\sqrt{\frac{1 - n_{x}^{2} - n_{y}^{2}}{1 - {n_{x}^{2}/M^{2}} - {n_{y}^{2}/M^{2}}}}\frac{I}{o}\left( {{nx},{ny}} \right)}} & \left( {{Equation}\mspace{14mu} 11} \right)\end{matrix}$

The logarithm of this result can be expanded in a Zernike polynomialbasis functions (FIG. 25). We can further deconvolve the result ofEquation 11 to take out the effects of possible pinhole averaging.

Process for Measuring T (nx, ny) Second Embodiment

FIG. 26 is a flow chart illustrating an embodiment for measuring theexit pupil transmission using an electronic sensor. For example, ifimages are recorded electronically (e.g., on a CCD array) instead of inphotoresist, the steps outlined in FIG. 26 may be followed. A differencebetween this and the previous method, shown in FIG. 24, is that recordedsensor output directly provides the “raw” intensity or signal for theradiant intensity. If necessary, gain offsets or appropriate mappingscan be used to correct the raw intensity signals and arrive at a finalnormalized radiant intensity (see Equation 10). In addition, forimmersion systems operating at a similar dry NA (NAwet=NAdry), the depthof focus requirements for the electronic recording device are alsoconsidered. Deconvolution of pinhole effects can then proceed as in thefirst embodiment.

Flow begins in block 2602 where an MFISIS is provided. Flow continues toblock 2604 and the MFISIS is loaded onto the machine. Then in block 2606an electronic sensing array is exposed at one or more doses. Flow thencontinues to block 2608 and T( nx, ny) is reconstructed.

Process for Amelioration of Transmission Error

Several methods for the amelioration of transmission related errorsuniquely associated with the photolithographic exposure tool using thetransmission function T(nx,ny,x,y) as determined by the apparatus andmethod of measurement for the preferred embodiment are now discussed.

Numerical Aperture Error Adjustment

First, for each field point (i) extract the numerical aperture (NA;)from the effective T(nx,ny)_(i); map by determining the sine of themaximum half angle as a function of theta (angular extent of the pupil).This then yields the effective NA for each field point. Next, calculatethe average NA (NAavg) for the system by simply summing over the totalnumber of field points (N): or, NAavg=ΣNA_(i)/N. To the extent thisdiffers from the nominal or desired NA setting, the physical blades atthe appropriate aperture stop (AS, FIG. 1) can be adjusted to thedesired setting.

Numerical Aperture Error Adjustment (Elliptical Systems)

A method for the amelioration of the exit pupil numerical aperture errorfor elliptically adjustable photolithographic exposure systems(elliptical NA systems) comprising the following steps: Step 1, usingthe methods of this invention for determining T(nx,ny) as a function offield position, determine the x and y components of the NA (NAx, NAy)for each field point—using an averaging process for each component. Step2, determine the largest eccentricity in NA for all field pointsmeasured (or interpolated) using ΔNA=max|NAx−NAy|. Step 3, ifΔNA>process tolerance (known or determined by simulation) make machineadjustments to correct the problem (e.g., adjust elliptical NA systemparameters).

Numerical Aperture Misalignment

A method for the correcting aperture misalignment comprising thefollowing steps: Step 1, calculate the average error using the followingequation and the known transmission function:

<nc _(i) >=∫ n*T( n )*do _(n) /∫T( n )do _(n)  (Equation 12)

Where: do_(n)=d²n/sqrt(1−n²), is the solid-angle, n is the directioncosine, and <nc_(i)> represents the average direction cosine of eachfield point, whose ideal value is zero. Step 2, determine <nc> (theaverage aperture offset for all field points) using:

${\langle{nc}\rangle} = {\sum\limits_{1}{{\langle{nc}_{i}\rangle}/{N.}}}$

Step 3, correct for this overall aperture offset by shifting theappropriate stop to make <nc>=zero.

Sampling: Since we expect lens transmission to change over time (see“Impact of Across Pupil Transmittance Variation in Projection Lenses onFine Device Pattern Imaging”, supra), in-situ transmission measurementscan be made at appropriate time intervals—logging or recordingtransmission maps as a function of time can be used to help identifyroot cause and provide for an appropriate amelioration schedule.

Gray Level Correction

A method for amelioration of transmission errors across the exposurefield comprising the following steps: Step 1, determine the transmissioncharacteristics for the photolithographic exposure system as describedin the preferred embodiment. Step 2, calculate Tavg(n)=ΣT(n)_(i)/N—theaverage value of the transmission for each field point as a function ofdirection cosine. Step 3, configure a gray-level pupil filter to averageout the high levels of transmission in the pupil plane—for thosephotolithographic systems with accessible pupils. Note: Tavg(n)<1, andthe filter is adjusted spatially to reduce the higher intensity areas tothe normalized background intensity.

Variations of the Main Embodiments

A number of variations of the embodiments described above are possible.

In all of the MFISIO designs, image distortion is not a significantdesign constraint since to the extent it is known (vis a vis its designvalue) it can be compensated for, as will be known to those skilled inthe art.

Polarization:

The apparatus and method for the preferred embodiment can be configuredto measure transmission sensitivity to polarization by using anunpolarized light source or a source with an adjustable polarization.For the case of an unpolarized source, the illumination optics orreticle (for the preferred embodiment) can be adjusted (possibly incombination) in such a way as to deliver polarized light (given by theproper Jones vector) to the wafer plane. Changes to the illuminationsystem include combinations of polarizers, filters, and possiblysub-resolution gratings (see E. Hecht, “Optics”, Addison Wesley, 2ndEdition, 1987, pp. 279, 497). Changes to the reticle for the preferredembodiment include adding sub-resolution gratings to the ISIS structure(two possible configurations are shown in FIGS. 27 and 28) on any one ofthe following surfaces or materials: piano convex lens top, bottom,reticle top or bottom, pinhole opening. In addition, polarizing filterscan be used and added in a similar manner, or the pinhole shape can takethe form of a slit with a direction perpendicular to the desiredpolarization state. In addition, variations to the ISIS structures shownin FIGS. 4, 11, 12, 14, 15 and 16 are also possible using the sametechniques with regard to configuration design and polarization. Forlight sources with adjustable polarization, the reticle can be adjustedas described above, however, since it is possible that illuminationoptics can change polarization, measurements should be made to determinethe polarization state of the light hitting the ISIS structure. Thisway, the ISIS structures can accommodate such changes. The informationobtained, namely, differences in transmission for different polarizationstates can be used to study (simulate) polarization induced contrastloss—a function of direction cosine at the wafer plane.

Reticle Side Telecentricity:

An apparatus and process for the determination of reticle sidetelecentricity (RSTC) as a function of field position is shown in FIG.29. FIG. 29 is a flow diagram illustrating an embodiment for thedetermination of reticle side telecentricity (RSTC) as a function offield position. Flow begins in block 2902 where an MFISIS and referenceframe are provided. Then in block 2904 the MFISIS is loaded onto themachine. Then in block 2906 an expose dose is meander on one or morewafers. Then in block 2908 the wafer is developed. In block 2910 thedeveloped images of the exit pupil at varying doses are photographed.Flow continues to block 2912 and T( nx, ny) is reconstructed.

Then in block 2914, the method includes measuring the distance betweenthe center of the image frame and the center of exit pupil (as printedin resist)—as a function of field position, calculating the individualRSTC components using;

${nx}_{TEL} = {{\left( \frac{x_{p} - x_{c}}{Z_{ap}} \right)*M\mspace{14mu} {and}\mspace{14mu} {ny}_{TEL}} = {\left( \frac{y_{p} - y_{c}}{Z_{ap}} \right)*M\text{:}}}$

where xp, yp and xc, yc are positions at the wafer for a given fieldpoint and are scaled by the system magnification and aperture platedistance (FIG. 3), and storing the results in a database. The functionaldependence of RSTC components can be expressed (fit-to) in terms of aradial polynomial such as (ao+a1*r+a2*r²). Then in block 2916, thesevalues may be entered into a database for use, for example, with themethods described in “In-Situ Source Metrology Instrument and Method ofUse”, supra—where the effects of RSTC need to be accounted for.

The present invention has been described above in terms of presentlypreferred embodiments so that an understanding of the present inventioncan be conveyed. There are, however, many configurations for determiningexit pupil transmittance not specifically described herein but withwhich the present invention is applicable. The present invention shouldtherefore riot be seen as limited to the particular embodimentsdescribed herein, but rather, it should be understood that the presentinvention has wide applicability with respect to image projectionsystems. All modifications, variations, or equivalent arrangements andimplementations that are within the scope of the attached claims shouldtherefore be considered within the scope of the invention.

1. A light conditioner for a projection imaging system, the lightconditioner comprising: an optical input; and an optical output, whereinthe light conditioner receives light at the optical input from a lightsource and outputs a substantially uniform illumination light with anangular extent that is greater than an angular size of an entrance pupilof the projection imaging system.
 2. A light conditioner comprising: areticle having a top and bottom surface; a lens and means for mountingsame to said reticle; an aperture plate and means for mounting same tosaid reticle.
 3. A light conditioner as defined in claim 2, wherein saidlens is mounted above reticle top surface and substantially focuses onsaid aperture plate which is attached to reticle top surface.
 4. A lightconditioner as defined in claim 2, wherein said lens is mounted belowreticle bottom surface and substantially focuses on said aperture platewhich is also attached to reticle bottom surface.
 5. A light conditioneras defined in claim 2, wherein said lens is a ball lens.
 6. A lightconditioner as defined in claim 4, wherein said lens is a ball lens. 7.A method of determining a reticle side telecentricity of a projectionimaging system, the method comprising: providing an illumination sourcewith a substantially uniform illumination with an angular extent that isgreater than an angular size of an entrance pupil of the projectionimaging system; exposing a recording media with illumination from theillumination source that is emitted from an exit pupil of the projectionimaging system; reconstructing a transmission function of the projectionimaging system as a function of field position from the exposedrecording media; determining a difference between a center of areference frame and a center of the exposed exit pupil for each fieldpoint; and calculating individual components of reticle sidetelecentricity.
 8. A method as defined in claim 7, further comprisingfitting the components to a polynomial function.
 9. A method as definedin claim 7, wherein the projection imaging system comprises a stepper, ascanner, a scanner configured for immersion lithography, or a stepperconfigured for immersion lithography.
 10. A method as defined in claim7, wherein the recording media comprises a photoresist, an electronicdevice, or a CCD structure.
 11. A method as defined in claim 7, whereinexposing comprises multiple sub-exposures.
 12. The light conditioner ofclaim 1 further comprising: a reticle having a top and bottom surface; alens and means for mounting same to said reticle; and an aperture plateand means for mounting same to said reticle.
 13. The light conditionerof claim 12, wherein said lens is mounted above the reticle top surfaceand substantially focuses on said aperture plate which is attached toreticle top surface.
 14. The light conditioner of claim 12, wherein saidlens is mounted below the reticle bottom surface and substantiallyfocuses on said aperture plate which is also attached to reticle bottomsurface.
 15. The light conditioner of claim 14, wherein said lens is aball lens.
 16. The light conditioner of claim 12, wherein said lens is aball lens.